MÜLLER, Tobias; SCHMIDT, Thorsten; RANK, Sebastian; SCHNEIDER, Germar. Eigenfrequenzbestimmung von Wafern. Logistics Journal: Proceedings, [S. l.], n. 13, 2017. DOI: 10.2195/lj_Proc_mueller_de_201710_01. Disponível em: https://proc.logistics-journal.de/article/view/868. Acesso em: 4 apr. 2025.